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NB6L11S

2.5 V 1:2 AnyLevel Input to LVDS Fanout Buffer / Translator

ON Semiconductor 

NB6L11S

Table 2. ATTRIBUTES

Characteristic

ESD Protection

Human Body Model

Machine Model

Charged Device Model

Moisture Sensitivity (Note 2)

QFN−16

Flammability Rating Oxygen Index: 28 to 34

Transistor Count

Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test

2. For additional information, see Application Note AND8003/D.

Value

> 2 kV

> 200 V

> 1 kV

Pb−Free Pkg

Level 1

UL 94 V−0 @ 0.125 in

225

Table 3. MAXIMUM RATINGS

Symbol

Parameter

Condition 1

Condition 2

Rating

Unit

VCC

Positive Power Supply

VIN

Positive Input

IIN

Input Current Through RT (50 W Resistor)

GND = 0 V

GND = 0 V

Static

Surge

VIN ≤ VCC

3.8

V

3.8

V

35

mA

70

mA

IOSC

Output Short Circuit Current

Line−to−Line (Q to Q)

Line−to−End (Q or Q to GND)

Q or Q to GND

Q to Q

Continuous

Continuous

mA

12

24

TA

Operating Temperature Range

QFN−16

Tstg

Storage Temperature Range

qJA

Thermal Resistance (Junction−to−Ambient) (Note 3) 0 lfpm

500 lfpm

QFN−16

QFN−16

−40 to +85

−65 to +150

41.6

35.2

°C

°C

°C/W

°C/W

qJC

Thermal Resistance (Junction−to−Case)

1S2P (Note 3)

QFN−16

4.0

°C/W

Tsol

Wave Solder

Pb−Free

265

°C

Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the

Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect

device reliability.

3. JEDEC standard multilayer board − 1S2P (1 signal, 2 power) with 8 filled thermal vias under exposed pad.

http://onsemi.com

3

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