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IDT71342SA

HIGH-SPEED 4K x 8 DUAL-PORT STATIC RAM WITH SEMAPHORE

Integrated Device Technology 

IDT71342SA/LA

High-Speed 4K x 8 Dual-Port Static RAM with Semaphore

Industrial and Commercial Temperature Ranges

Data Retention Characteristics

(LA Version Only) VLC = 0.2V, VHC = VCC - 0.2V

Symbol

Parameter

Test Condition

Min.

Typ.(1)

Max. Unit

VDR

VCC for Data Retention

___

2.0

___

V

ICCDR

Data Retention Current

VCC = 2V, CE > VHC

COM'L. & IND.

___

100

1500 µ A

tCDR(3)

tR(3)

Chip Deselect to Data Retention Time

Operation Recovery Time

SEM > VHC

VIN > VHC or < VLC

0

___

tRC(2)

___

___

ns

___

ns

NOTES:

1. VCC = 2V, TA = +25°C, and are not production tested.

2. tRC = Read Cycle Time.

3. This parameter is guaranteed by device characterization, but is not production tested.

2721 tbl 07

Data Rention Waveform

VCC

4.5V

tCDR

CE

VIH

DATA RETENTION MODE

VDR > 2V

VDR

4.5V

tR

VIH

AC Test Conditions

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

Output Load

GND to 3.0V

5ns

1.5V

1.5V

Figures 1 and 2

2721 tbl 08

2721 drw 04

+5V

+5V

DATAOUT

775Ω

1250Ω

30pF

DATAOUT

775Ω

1250Ω

5pF *

,

2721 drw 05

Figure 1. AC Output Test Load

,

2721 drw 06

Figure 2. Output Test Load

(for tLZ, tHZ, tWZ, tOW)

*Including scope and jig

6.542

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