IDT70P3517 Просмотр технического описания (PDF) - Integrated Device Technology

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Компоненты Описание

Список матч

IDT70P3517

512K/256K x36 SYNCHRONOUS DUAL QDR-II™

Integrated Device Technology 

18/9Mb x36 IDT70P3537/70P3517

SYNCHRONOUS Dual QDR-IITM

Overshoot Timing

Preliminary Datasheet

Commercial Temperatue Range

Undershoot Timing

VIL

VSS

VSS -0.25V

VSS -0.5V

20% tKHKH (MIN)

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AC Test Loads

VREF

OUTPUT

Device

Under

Test

ZQ

VDDQ/2

Z0 = 50Ω

RL = 50Ω

RQ = 250Ω

VDDQ/2

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AC Test Conditions

Parameter

Core Power Supply Voltage

Output Power Supply Voltage

Input High Level

Input Low Level

Input Reference Level

Input Rise/Fall Time

Output Timing Reference Level

Symbol

VDD

VDDQ

VIH

VIL

VREF

TR/TF

NOTE:

1. Parameters are tested with RQ=250Ω.

Value

1.7-1.9

1.4-1.9

(VDDQ/2) +0.5

(VDDQ/2) -0.5

VDDQ/2

0.3/0.3

VDDQ/2

Unit

V

V

V

V

V

ns

V

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(VDDQ/2) +0.5V

(VDDQ/2) -0.5V

VDDQ/2

5677 drw08

10

July 16, 2007

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