STK12C68-C45 Просмотр технического описания (PDF) - Cypress Semiconductor
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STK12C68-C45 Datasheet PDF : 20 Pages
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STK12C68
Data Retention and Endurance
Parameter
Description
DATAR
NVC
Data Retention
Nonvolatile STORE Operations
Min
100
1,000
Unit
Years
K
Capacitance
In the following table, the capacitance parameters are listed.[6]
Parameter
Description
CIN
COUT
Input Capacitance
Output Capacitance
TA = 25°C, f = 1 MHz,
VCC = 0 to 3.0 V
Test Conditions
Max
Unit
8
pF
7
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.[6]
Parameter Description
Test Conditions
ΘJA Thermal Resis-
tance
Test conditions follow
standard test methods and
(Junction to
procedures for measuring
Ambient)
thermal impedance, per EIA /
ΘJC Thermal Resis-
tance
JESD51.
(Junction to Case)
28-SOIC
46.55
27.95
28-PDIP
(300 mil)
45.16
31.62
28-PDIP
(600 mil)
55.84
25.74
28-CDIP
46.1
5.01
28-LCC
95.31
9.01
Unit
°C/W
°C/W
5.0V
R1 963Ω
Figure 6. AC Test Loads
5.0V
R1 963Ω For Tri-state Specs
Output
30 pF
R2
512Ω
Output
5 pF
R2
512Ω
AC Test Conditions
Input Pulse Levels .................................................. 0 V to 3 V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Note
6. These parameters are guaranteed by design and are not tested.
Document Number: 001-51027 Rev. **
Page 8 of 20
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