STK12C68-5 Просмотр технического описания (PDF) - Cypress Semiconductor
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STK12C68-5 Datasheet PDF : 18 Pages
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STK12C68-5 (SMD5962-94599)
Data Retention and Endurance
Parameter
DATAR
NVC
Description
Data Retention
Nonvolatile STORE Operations
Min
100
1,000
Unit
Years
K
Capacitance
In the following table, the capacitance parameters are listed.[6]
Parameter
CIN
COUT
Description
Input Capacitance
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 0 to 3.0 V
Max
Unit
8
pF
7
pF
Thermal Resistance
In the following table, the thermal resistance parameters are listed.[6]
Parameter
ΘJA
ΘJC
Description
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Test Conditions
28-CDIP 28-LCC
Test conditions follow standard test methods and
procedures for measuring thermal impedance, per
EIA / JESD51.
TBD
TBD
TBD
TBD
Unit
°C/W
°C/W
Figure 7. AC Test Loads
5.0V
R1 963Ω
5.0V
R1 963Ω For Tri-state Specs
Output
30 pF
R2
512Ω
Output
5 pF
R2
512Ω
AC Test Conditions
Input Pulse Levels .................................................... 0V to 3V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .......................1.5
Note
6. These parameters are guaranteed by design and are not tested.
Document Number: 001-51026 Rev. **
Page 8 of 18
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