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HCF4034 Просмотр технического описания (PDF) - STMicroelectronics

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HCF4034 Datasheet PDF : 16 Pages
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HCC/HCF4034B
inputs generated internally to allow synchronous or
asynchronous data transfer from master to slave.
Isolation from external noise and the effects of load-
ing is provided by output buffering.
PARALLEL OPERATION – A high P/S input signal
allows data transfer into the register via the parallel
data lines synchronously with the positive transition
of the clock provided the A/S input is low. If the A/S
input is high the transfer is independent of the clock.
The direction of data flow is controlled by the A/B
input. When this signal is high the A data lines are
inputs (and B data lines are outputs) ; a low A/B sig-
nal reverses the direction of data flow. The AE-input
is an additional feature which allows many registers
to feed data to a common bus. The A DATA lines are
FUNCTIONAL DIAGRAM
enabled only when this signal is high. Data storage
through recirculation of data in each register stage
is accomplished by making the A/B signal high and
the AE signal low.
SERIALOPERATION – A low P/S signal allows ser-
ial data to transfer into the register synchronously
with the positive transition of the clock. The A/S input
is internally disabled when the register is in the serial
mode (asynchronous serial operation is not
allowed). The serial data appears as output data on
either the B lines (when A/B is high) or the A lines
(when A/B is low and the AE signal is high). Register
expansion can be accomplished by simply cascad-
ing HCC/HCF4034B packages.
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VDD* Supply Voltage : HCC Types
HCF Types
– 0.5 to + 20
V
– 0.5 to + 18
V
Vi Input Voltage
– 0.5 to VDD + 0.5
V
II
DC Input Current (any one input)
± 10
mA
Ptot Total Power Dissipation (per package)
Dissipation per Output Transistor
for Top = Full Package-temperature Range
200
mW
100
mW
Top Operating Temperature : HCC Types
HCF Types
– 55 to + 125
°C
– 40 to + 85
°C
Ts tg Storage Temperature
– 65 to + 150
°C
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational sec-
tions of this specification is not implied. Exposure to absolute maximum rating conditions for external periods may affect device
r eli abil ity .
2/16

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