CY7C130A Просмотр технического описания (PDF) - Cypress Semiconductor
Номер в каталоге
Компоненты Описание
Список матч
CY7C130A Datasheet PDF : 22 Pages
| |||
CY7C130, CY7C130A
CY7C131, CY7C131A
Maximum Ratings[5]
Exceeding maximum ratings may shorten the useful life of the
device. User guidelines are not tested.
Storage temperature ................................ –65 C to +150 C
Ambient temperature with
power applied ........................................... –55 C to +125 C
Supply voltage to ground potential
(pin 48 to pin 24)...........................................–0.5 V to +7.0 V
DC voltage applied to outputs
in high Z State...............................................–0.5 V to +7.0 V
DC input voltage ...........................................–3.5 V to +7.0 V
Output current into outputs (LOW) .............................. 20 mA
Static discharge voltage.......................................... > 2001 V
(per MIL-STD-883, method 3015)
Latch-up current .................................................... > 200 mA
Operating Range
Range
Commercial
Industrial
Military[6]
Ambient Temperature
0 C to +70 C
–40 C to +85 C
–55 C to +125 C
VCC
5 V ± 10%
5 V ± 10%
5 V ± 10%
Electrical Characteristics
Over the Operating Range[7]
Parameter
Description
Test Conditions
7C131-15[4]
7C131A-15
7C141-15
7C130-30[4]
7C130A-30
7C131-25,30
7C140-30
7C141-25,30
7C130-35,45
7C131-35,45
7C140-35,45
7C141-35,45
7C130-55
7C131-55
7C140-55
7C141-55
Unit
Min Max Min Max Min Max Min Max
VOH
Output HIGH voltage VCC = Min, IOH = –4.0 mA
2.4 – 2.4 – 2.4 – 2.4 – V
VOL
Output LOW voltage IOL = 4.0 mA
IOL = 16.0 mA[8]
– 0.4 – 0.4 – 0.4 – 0.4 V
– 0.5 – 0.5 – 0.5 – 0.5 V
VIH
Input HIGH voltage
2.2 – 2.2 – 2.2 – 2.2 – V
VIL
Input LOW voltage
– 0.8 – 0.8 – 0.8 – 0.8 V
IIX
Input leakage current GND < VI < VCC
–5 +5 –5 +5 –5 +5 –5 +5 µA
IOZ
Output leakage current GND < VO < VCC, output disabled –5 +5 –5 +5 –5 +5 –5 +5 µA
IOS
Output short circuit
current[9, 10]
VCC = Max,
VOUT = GND
– –350 – –350 – –350 – –350 mA
ICC
VCC operating supply
current
CE = VIL,
open, f =
outputs
fMAX[11]
Commercial – 190
–
170
–
120 – 110 mA
ISB1
Standby current both
ports, TTL inputs
Cf =ELfMaAnXd[11C]ER > VIH, Commercial
–
75
–
65
–
45 – 35 mA
ISB2
Standby current one CEL or CER > VIH, Commercial – 135 – 115 – 90 – 75 mA
port, TTL inputs
active port outputs
open, f = fMAX[11]
ISB3
Standby current both Both ports CEL and Commercial – 15 – 15 – 15 – 15 mA
ports, CMOS inputs CER > VCC – 0.2 V,
VIN > VCC – 0.2 V
or VIN < 0.2 V, f = 0
ISB4
Standby current one One port CEL or
Commercial – 125 – 105 – 85 – 70 mA
port, CMOS inputs
CER > VCC – 0.2 V,
VIN > VCC – 0.2 V
or VIN < 0.2 V,
active port outputs
open, f = fMAX[11]
Shaded areas contain preliminary information.
Notes
5. The voltage on any input or I/O pin cannot exceed the power pin during power up.
6. TA is the “instant on” case temperature
7. See the last page of this specification for Group A subgroup testing information.
8. BUSY and INT pins only.
9. Duration of the short circuit should not exceed 30 seconds.
10. This parameter is guaranteed but not tested.
11. At f = fMAX, address and data inputs are cycling at the maximum frequency of read cycle of 1/tRC and using AC Test Waveforms input levels of GND to 3 V.
Document Number: 38-06002 Rev. *H
Page 5 of 22
Share Link: 