DESCRIPTION:
Maxwell Technologies’ 28C256T high density 256k-bit EEPROM microcircuit features a greater than 100 krad (Si) total dose tolerance, depending upon space mission. The 28C256T is capable of in-system electrical byte and page programmability. It has a 64-Byte page programming function to make its erase and write operations faster. It also features data polling to indicate the completion of erase and program ming operations.

FEATURES:
• RAD-PAK® radiation-hardened against natural space radiation
• Total dose hardness:
- > 100 Krad (Si), dependent upon space mission
• Excellent Single Event Effects:
- SELTH LET: > 120 MeV/mg/cm2
- SEUTH LET (read mode): > 90 MeV/mg/cm2
- SEUTH LET (write mode): > 18 MeV/mg/cm2
• Package:
- 28 pin RAD-PAK® flat pack
- 28 pin RAD-PAK® DIP
- JEDEC approved byte wide pinout
• High Speed:
- 120, 150 ns maximum access times available
• High endurance:
- 10,000 erase/write (in Page Mode), 10-year data retention
• Page Write Mode:
- 1 to 64 bytes
• Low power dissipation:
- 15 mA active current (cycle = 1 µs)
- 20 µA standby current (CE = VCC)