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NLX1G11MUTCG Просмотр технического описания (PDF) - ON Semiconductor

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NLX1G11MUTCG
ON-Semiconductor
ON Semiconductor ON-Semiconductor
NLX1G11MUTCG Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
NLX1G11
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
VCC
VIN
VOUT
IIK
IOK
IO
ICC
IGND
TSTG
TL
TJ
qJA
PD
MSL
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Source/Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Thermal Resistance (Note 1)
Power Dissipation in Still Air @ 85°C
Moisture Sensitivity
VIN < GND
VOUT < GND
−0.5 to +7.0
−0.5 to +7.0
−0.5 to +7.0
−50
−50
±50
±100
±100
−65 to +150
260
150
496
252
Level 1
V
V
V
mA
mA
mA
mA
mA
°C
°C
°C
°C/W
mW
FR
Flammability Rating Oxygen
Index: 28 to 34
UL 94 V−0 @ 0.125 in
VESD
ESD Withstand Voltage
Human Body Model (Note 2)
>2000
V
Machine Model (Note 3)
>200
Charged Device Model (Note 4)
N/A
ILATCHUP Latchup Performance Above VCC and Below GND at 125 °C (Note 5)
±500
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2 ounce copper trace no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA / JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
Positive DC Supply Voltage
Operating
1.65
5.5
V
Data Retention Only
1.5
5.5
VIN
Digital Input Voltage (Note 6)
0
5.5
V
VOUT Output Voltage
0
5.5
V
TA
Operating Free−Air Temperature
−55
+125
°C
Dt/DV Input Transition Rise or Fall Rate
VCC = 1.8 V ± 0.15 V
0
VCC = 2.5 V ± 0.2 V
0
VCC = 3.3 V ± 0.3 V
0
VCC = 5.0 V ± 0.5 V
0
20
ns/V
20
10
5
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
6. Unused inputs may not be left open. All inputs must be tied to a high or low−logic input voltage level.
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