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NJM2275F1

VHF/UHF BAND RF AMPLIFIER

Japan Radio Corporation  

NJM2275

TEST CIRCUIT

These test circuits allow the measurement of all parameters described in “ELECTRICAL CHARACTERISTICS”.

Test Circuit 1 for Icc, PG , P–1dB and Pin vs. Pout

L in

27n

C in

1000p

RF IN

1

SG

(50Ω)

GND

2

Cb BIAS CAP

1000p

3

Test Circuit 2 for VG

V+

V+

6

I REF Cref

5

1000p

Cv

1000p

RF OUT

4

CL RL

2p 0Ω

Lout Cout

15n 8p

Spe ctr um

Analyz e r

(Zin=50Ω)

L in

27n

C in

1000p

RF IN

1

SG

(50Ω)

GND

2

Cb BIAS CAP

1000p

3

V+

V+

6

I REF Cref

1000p

5

Cv

1000p

RF OUT

4

CL RL

1000p 1kΩ

Lout Cout

27n 4p

Spe ctr um

Analyzer

(Zin=50Ω)

PG and VG has the following relation.

PG = Pout – Pin

VG = (Pout + Prl ) – Pin

where

Pin = input level in dBm

Pout = output level in dBm

Prl = the loss caused by the voltage drop of RL.

RL is 1000 Ω. The input impedance of spectrum analyzer Zin is 50Ω. Prl is calculated from

Prl = 20log ( ( RL + Zin) / RL)

Prl = 20 log (1050 / 50 )

Ver.2005-06-01

-3-

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