CBT3245A Просмотр технического описания (PDF) - NXP Semiconductors.
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CBT3245A Datasheet PDF : 16 Pages
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NXP Semiconductors
12. Test information
CBT3245A
Octal bus switch
tW
VI 90 %
negative
pulse
VM
10 %
0V
tf
VI
positive
pulse
tr
90 %
VM
10 %
0V
tW
VI
G
VCC
VO
DUT
RT
VM
tr
tf
VM
VEXT
RL
CL
RL
001aae331
Fig 7.
Test data is given in Table 9.
All input pulses are supplied by generators having the following characteristics: PRR 10 MHz; Zo = 50 .
The outputs are measured one at a time with one transition per measurement.
Definitions for test circuit:
RL = Load resistance.
CL = Load capacitance including jig and probe capacitance.
RT = Termination resistance should be equal to output impedance Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Test circuit for measuring switching times
Table 9. Test data
Supply voltage
VCC = 5.0 V 0.5 V
Input
VI
tr, tf
GND to 3.0 V 2.5 ns
Load
CL
50 pF
RL
500
VEXT
tPLH, tPHL
open
tPLZ, tPZL
7.0 V
tPHZ, tPZH
open
CBT3245A
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 3 — 5 January 2012
© NXP B.V. 2012. All rights reserved.
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