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ADP3510ARU

CDMA Power Management System

Analog Devices 

ADP3510

Parameter

Symbol

Conditions

Min Typ Max Unit

BATTERY VOLTAGE DIVIDER

Divider Ratio

Divider Impedance at MVBAT

Divider Leakage Current

Divider Resistance

BATTERY CHARGER

Charger Output Voltage

Charger Output Voltage

Load Regulation

CHRDET on Threshold

CHRDET Hysteresis

CHRDET Off Delay3

CHRIN Supply Current

Current Limit Threshold

High Current Limit

(100%: UVLO Not Active)

Low Current Limit

(10%: UVLO Active)

ISENSE Bias Current

End of Charge Signal Threshold

End of Charge Reset Threshold

GATEDR Transition Time

GATEDR High Voltage

GATEDR Low Voltage

Output High Voltage

(EOC, CHRDET)

Output Low Voltage

(EOC, CHRDET)

Battery Overvoltage

Protection Threshold

(GATEDRÆHigh)

Battery Overvoltage

Protection Hysteresis

BATSNS/MVBAT

ZO

TCXOEN = High

TCXOEN = Low

TCXOEN = High

2.94 3.00 3.06

50 80 110 kW

1

mA

230 350 430 kW

BATSNS

BATSNS

⌬BATSNS

CHRIN–VBAT

CHRIN–ISENSE

CHRIN–ISENSE

VBAT

tR, tF

VOH

VOL

VOH

4.5 V < CHRIN < 10 V,

CHGEN = Low,

TA = 0∞C to 50∞C

CHRIN = 10 V, VSENSE = 10 mV,

TA = 0∞C to 50∞C

CHRIN = 5 V,

0 < CHRIN – ISENSE

< Current Limit Threshold,

CHGEN = Low

VBAT = 3.6 V

CHRIN < VBAT

CHRIN = 5 V

4.158 4.200

4.162 4.200

2

260

70

6

0.6

4.242

4.238

8

1

CHRIN = 5 V dc

VBAT = 3.6 V

CHGEN = Low

CHRIN = 5 V

VBAT = 2 V

CHGEN = Low

CHRIN = 5 V

CHRIN = 5 V dc

VBAT > 4.0 V

CHGEN = Low

CHGEN = Low

CHRIN = 5 V

VBAT > 3.6 V

CHGEN = High, CL = 2 nF

CHRIN = 5 V

VBAT = 3.6 V

CHGEN = High

GATEIN = High

IOH = –1 mA

CHRIN = 5 V

VBAT = 3.6 V

CHGEN = High

GATEIN = Low

IOL = +1 mA

IOH = –250 mA

150 172 195

2 15 30

180 250

2 12 26

3.82 3.96 4.10

1

10

4.5

0.5

2.4

V

V

mV

mV

mV

ms/nF

mA

mV

mV

mA

mV

V

ms

V

V

V

VOL

IOL = +250 mA

0.25 V

BATSNS

BATSNS

CHRIN = 7.5 V

CHGEN = High

GATEIN = Low

CHRIN = 7.5 V

CHGEN = High

GATEIN = Low

5.30 5.50 5.70 V

400

mV

NOTES

1All limits at temperature extremes are guaranteed via correlation using standard Statistical Quality Control (SQC) methods.

2This feature is intended to protect against catastrophic failure of the device. Maximum allowed operating junction temperature is 125؇C. Operation beyond 125؇C could cause

permanent damage to the device.

3Delay set by external capacitor on the RESCAP pin.

Specifications subject to change without notice.

–4–

REV. 0

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