HEF4794B-Q100 Просмотр технического описания (PDF) - NXP Semiconductors.
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HEF4794B-Q100 Datasheet PDF : 14 Pages
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Nexperia
HEF4794B-Q100
8-stage shift-and-store register LED driver
VI
90 %
input pulse
10 %
VSS
tr
tf
VEXT
G
VI
VDD
RL
VO
DUT
RT
CL
001aag804
Test data is given in Table 10.
Definitions for test circuit:
DUT - Device Under Test.
RL = Load resistance.
CL = load capacitance.
RT = Termination resistance should be equal to output impedance of Zo of the pulse generator.
VEXT = External voltage for measuring switching times.
Fig. 10. Test circuit for measuring switching times
Table 10. Test data
Supply
Input
VDD
VI
5 V to 15 V
VDD
tr, tf
≤ 20 ns
VEXT
tPLZ, tPZL
VDD
tPLH, tPHL
open
Load
CL
50 pF
RL
1 kΩ
11. Application information
VDD
VDD
PWM
dimmer input
QP0
D
OE
HEF4794B
STR
CP
QP7
S2
QP0
D
OE
HEF4794B
STR
CP
CONTROL
AND
SYNC
CIRCUITRY
data
clock
from remote
control panel
Fig. 11. Application example: serial-to-parallel data converting LED drivers
QP7
S2
001aag806
HEF4794B_Q100
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 2 — 7 November 2018
© Nexperia B.V. 2018. All rights reserved
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