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74ABT544PW,118

Octal latched transceiver with dual enable; 3-state

NXP Semiconductors. 

NXP Semiconductors

74ABT544

Octal latched transceiver with dual enable; 3-state

Table 6. Static characteristics …continued

Voltages are referenced to GND (ground = 0 V).

Symbol Parameter

Conditions

VOL(pu)

II

IOFF

IO(pu/pd)

IOZ

ILO

IO

ICC

ICC

CI

CI/O

power-up LOW-level

output voltage

input leakage current

VCC = 5.5 V; IO = 1 mA;

VI = GND or VCC

VCC = 5.5 V; VI = GND or 5.5 V

control pins

An, Bn

power-off leakage

current

VCC = 0 V; VI or VO  4.5 V

power-up/power-down VCC = 2.1 V; VO = 0.5 V;

output current

VI = GND or VCC;

OEAB, OEBA don’t care

OFF-state output

current

VCC = 5.5 V; VI = VIL or VIH

VO = 2.7 V

VO = 0.5 V

output leakage current HIGH-state; VO = 5.5 V;

VCC = 5.5 V; VI = GND or VCC

output current

VCC = 5.5 V; VO = 2.5 V

supply current

VCC = 5.5 V; VI = GND or VCC

outputs HIGH-state

outputs LOW-state

outputs disabled

additional supply

current

per input pin; VCC = 5.5 V; one input

pin at 3.4 V, other inputs at VCC or

GND

input capacitance

input/output

capacitance

VI = 0 V or VCC

outputs disabled; VO = 0 V or VCC

25 C

40 C to +85 C Unit

Min Typ Max Min Max

[1] - 0.13 0.55

-

0.55 V

- 0.01 1.0

-

- 5.0 100 -

- 5.0 100 -

[2] - 5.0 50

-

1.0 A

100 A

100 A

50 A

- 5.0 50

-

- 5.0 50

-

- 5.0 50

-

[3] 180 65 50 180

50 A

50 A

50 A

50 mA

- 110 250

-

- 20 30

-

- 110 250

-

[4] -

0.3 1.5

-

250 A

30 mA

250 A

1.5 mA

-

4

-

-

-

7

-

-

- pF

- pF

[1] For valid test results, data must not be loaded into the flip-flops (or latches) after applying the power.

[2] This parameter is valid for any VCC between 0 V and 2.1 V, with a transition time of up to 10 ms. From VCC = 2.1 V to VCC = 5 V  10 %,

a transition time of up to 100 s is permitted.

[3] Not more than one output should be tested at a time, and the duration of the test should not exceed one second.

[4] This is the increase in supply current for each input at 3.4 V.

10. Dynamic characteristics

Table 7. Dynamic characteristics

GND = 0 V; for test circuit, see Figure 10.

Symbol Parameter

Conditions

tPLH

LOW to HIGH

An to Bn or Bn to An; see Figure 5

propagation delay LEBA to An or LEAB to Bn; see Figure 6

25 C; VCC = 5.0 V 40 C to +85 C; Unit

VCC = 5.0 V  0.5 V

Min Typ Max Min

Max

1.7 3.0 3.8 1.7

4.7 ns

2.1 3.5 4.2 2.1

5.2 ns

74ABT544

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 6 — 3 November 2011

© NXP B.V. 2011. All rights reserved.

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