SPT7610SIQ Просмотр технического описания (PDF) - Signal Processing Technologies
Номер в каталоге
Компоненты Описание
Список матч
SPT7610SIQ Datasheet PDF : 10 Pages
| |||
ELECTRICAL SPECIFICATIONS
TA = TMIN to TMAX, AVEE = –5.2 V, VRB = –1.00 V, VRM = –0.5 V, VRT = 0.00 V, ƒCLK = 1000 MSPS, Duty Cycle = 50%, unless otherwise specified.
PARAMETERS
TEST
CONDITIONS
TEST
LEVEL
SPT7610
MIN
TYP
MAX UNITS
Timing Characteristics
Clock to Data Ready delay (tdr)
Clock to Output Data (tod)
Output Data to Data Ready (todr)
Output Data Skew (tosk)
Aperture Jitter
Acquisition Time
+25 °C case
+25 °C case
–40 to 85 °C case
–40 to 85 °C case
V
950
ps
V
1.25
ns
IV
550
750
950 ps
IV
–150
150 ps
V
2
ps
V
250
ps
Dynamic Performance
Spurious Free Dynamic Range (SFDR)
ƒIN = 250 MHz
ƒIN = 400 MHz
Signal-to-Noise and Distortion (SINAD)
ƒIN = 250 MHz
ƒIN = 400 MHz
Signal to Noise Ratio (SNR)
ƒIN = 250 MHz
ƒIN = 400 MHz
Total Harmonic Distortion (THD)
ƒIN = 250 MHz
ƒIN = 400 MHz
V
45
dB
V
34
dB
VI
31
34
dB
VI
28
32
dB
VI
33
36
dB
VI
32
36
dB
VI
–40
–37 dB
VI
–34
–30 dB
TEST LEVEL CODES
All electrical characteristics are subject to the
following conditions:
All parameters having min/max specifications
are guaranteed. The Test Level column indi-
cates the specific device testing actually per-
formed during production and Quality Assur-
ance inspection. Any blank section in the data
column indicates that the specification is not
tested at the specified condition.
Unless otherwise noted, all test are pulsed
tests; therefore, TJ = TC = TA.
LEVEL
I
II
III
IV
V
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested at the
specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characteri-
zation data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is guaranteed
over specified temperature range.
SPT
3
SPT7610
12/19/00
Share Link: 