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W6662CF

SCANNER ANALOG FRONT END

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Preliminary W6662CF

7.5 Analog Characteristics (measures from analog input to ADC output), continued

PARAMETER

SYM. MIN. TYP‡ MAX.

UNITS

TEST CONDITIONS

Signal to Noise Ratio

SNR

57

dB

Note 3

from analog I/P to ADC O/P

‡: Typical figure are at VDD = 5V and temperature = 25° C and are for design aid only, not guaranteed and not subject to

production testing.

Notes:

1: 3V input span configured, PGA gain = 1, offset = 0 and measures from analog input to ADC output.

2: All steps of PGA gain and offset are monotonic.

3. 3V input span configured and analog 3V signal range.

7.5.1 Analog Characteristics (measures from ADC input to ADC output)

PARAMETER

Analog to Digital Converter

Maximum Conversion Rate

Resolution

Integral Nonlinearity

Differential Nonlinearity

SYM. MIN. TYP. MAX. UNITS TEST CONDITIONS

SPS

INL

DNL

3

12

+/- 1.5

+/- 1

MHz

Bits

LSB

LSB

Note

Note

Note: This is measured on the engineer sample and do not subject to production testing.

7.6 Timing Characteristics

PARAMETER

Clock Input Requirement

Conversion Rate

ADCCLK High pulse width

ADCCLK Low pulse width

Clamp pulse width

Sample data pulse width

Clamp to Sample

Sample data to ADC Convert

ADC Convert to Clamp

Analog signal Capture Delay of

CDS clocks

SYM.

MIN.

TYP.

tCVR

tADCH

tADCL

tCLP

tSPD

tC2S

tS2AD

tS2C

tACD

332

166

166

40

40

20

80

tS2AD+20

10

MAX. UNITS NOTES

nS

nS

nS

nS

nS

nS

nS

nS

nS

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