STK11C68 Просмотр технического описания (PDF) - Cypress Semiconductor
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STK11C68 Datasheet PDF : 16 Pages
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STK11C68
Capacitance
In the following table, the capacitance parameters are listed.[3]
Parameter
Description
CIN
COUT
Input Capacitance
Output Capacitance
Test Conditions
TA = 25°C, f = 1 MHz,
VCC = 0 to 3.0V
Thermal Resistance
In the following table, the thermal resistance parameters are listed.[3]
Parameter
ΘJA
ΘJC
Description
Thermal Resistance
(Junction to Ambient)
Thermal Resistance
(Junction to Case)
Test Conditions
Test conditions follow standard test methods
and procedures for measuring thermal
impedance, per EIA / JESD51.
Max
Unit
8
pF
7
pF
28-SOIC 28-CDIP 28-LCC Unit
TBD
TBD
TBD °C/W
TBD
TBD
TBD °C/W
5.0V
Figure 4. AC Test Loads
R1 480Ω
Output
30 pF
R2
255Ω
AC Test Conditions
Input Pulse Levels .................................................... 0V to 3V
Input Rise and Fall Times (10% to 90%) ...................... <5 ns
Input and Output Timing Reference Levels .................... 1.5V
Note
3. These parameters are guaranteed by design and are not tested.
Document Number: 001-50638 Rev. **
Page 6 of 16
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