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IDT61298

CMOS STATIC RAM 256K (64K x 4-BIT)

Integrated Device Technology 

IDT61298SA

CMOS STATIC RAM 256K (64K x 4-BIT)

COMMERCIAL TEMPERATURE RANGE

RECOMMENDED OPERATING

TEMPERATURE AND SUPPLY VOLTAGE

Grade

Temperature

GND

Vcc

Commercial

0°C to +70°C

0V

5V ± 10%

2971 tbl 05

RECOMMENDED DC OPERATING

CONDITIONS

Symbol

Parameter

Min. Typ. Max. Unit

VCC

Supply Voltage

4.5 5.0

5.5

V

GND

Supply Voltage

0

0

0

V

VIH

Input High Voltage 2.2 — VCC + 0.5V V

VIL

Input Low Voltage –0.5(1) —

0.8

V

NOTE:

2971 tbl 06

1. VIL (min.) = –1.5V for pulse width less than 10ns, once per cycle.

DC ELECTRICAL CHARACTERISTICS(1)

(VCC = 5V ± 10%, VLC = 0.2V, VHC = VCC - 0.2V)

61298SA12 61298SA15

Symbol

Parameter

Com’l. Mil. Com’l. Mil.

ICC

Dynamic Operating Current

CS = VIL, Outputs Open

VCC = Max., f = fMAX(2)

160 — 140

—

ISB

Standby Power Supply

Current (TTL Level)

CS ≥ VIH, VCC = Max.,

Outputs Open, f = fMAX(2)

50

— 45

—

ISB1 Full Standby Power

Supply Current (CMOS Level)

CS ≥ VHC, VCC = Max.,

f = 0(2), VLC ≥ VIN ≥ VHC

20

— 20

—

NOTES:

1. All values are maximum guaranteed values.

2. fMAX = 1/tRC (all address inputs are cycling at fMAX); f = 0 means no address input lines are changing.

Unit

mA

mA

mA

2971 tbl 07

AC TEST CONDITIONS

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

AC Test Load

5V

GND to 3.0V

3ns

1.5V

1.5V

See Figures 1 and 2

2971 tbl 08

DATAOUT

255Ω

480Ω

30pF*

DATA OUT

255Ω

5V

480Ω

5pF*

2971 drw 03

2971 drw 04

Figure 1. AC Test Load

Figure 2. AC Test Load

(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, tWHZ)

*Includes scope and jig capacitances

7.1

3

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