SI4012-A0-GT Просмотр технического описания (PDF) - Silicon Laboratories

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SI4012-A0-GT

CRYSTAL-LESSFSK/OOK RF TRANSMITTER

Silicon Laboratories 

1.1. Definition of Test Conditions

Production Test Conditions:

 TA = +25 °C

 VDD = +3.3 VDC

 TX output power measured at 100 MHz

 All RF output levels referred to the pins of the Si4012 (not the RF module)

Qualification Test Conditions:

 TA = –40 to +85 °C

 VDD = +1.8 to +3.6 VDC

 All RF output levels referred to the pins of the Si4012 (not the RF module)

Si4012

Rev 0.1

9

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