SCAN18374T Просмотр технического описания (PDF) - Fairchild Semiconductor

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SCAN18374T

D-Type Flip-Flop with 3-STATE Outputs

Fairchild Semiconductor 

Description of Boundary-Scan Circuitry (Continued)

Boundary-Scan Register Definition Index

Bit No.

Pin Name

Pin No.

Pin Type

41

AOE1

3

Input

40

ACP

54

Input

39

AOE

Internal

38

BOE1

26

Input

37

BCP

31

Input

36

BOE

Internal

35

AI0

55

Input

34

AI1

53

Input

33

AI2

52

Input

32

AI3

50

Input

31

AI4

49

Input

30

AI5

47

Input

29

AI6

46

Input

28

AI7

44

Input

27

AI8

43

Input

26

BI0

42

Input

25

BI1

41

Input

24

BI2

39

Input

23

BI3

38

Input

22

BI4

36

Input

21

BI5

35

Input

20

BI6

33

Input

19

BI7

32

Input

18

BI8

30

Input

17

AO0

2

Output

16

AO1

4

Output

15

AO2

5

Output

14

AO3

7

Output

13

AO4

8

Output

12

AO5

10

Output

11

AO6

11

Output

10

AO7

13

Output

9

AO8

14

Output

8

BO0

15

Output

7

BO1

16

Output

6

BO2

18

Output

5

BO3

19

Output

4

BO4

21

Output

3

BO5

22

Output

2

BO6

24

Output

1

BO7

25

Output

0

BO8

27

Output

Scan Cell Type

TYPE1

TYPE1

TYPE2

TYPE1

TYPE1

TYPE2

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE1

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

TYPE2

Control

Signals

A–in

B–in

A–out

B–out

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