SCAN18374T Просмотр технического описания (PDF) - Fairchild Semiconductor
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SCAN18374T Datasheet PDF : 12 Pages
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AC Operating Requirements
Scan Test Operation
VCC
TA = +25°C
TA = −40°C to +85°C
Symbol
Parameter
(V)
CL = 50 pF
CL = 50 pF
Units
(Note 11)
Guaranteed Minimum
tS
Setup Time, H or L
Data to TCK (Note 12)
5.0
3.0
3.0
ns
tH
Hold Time, H or L
TCK to Data (Note 12)
5.0
4.5
4.5
ns
tS
Setup Time, H or L
AOE1, BOE1 to TCK (Note 13)
tH
Hold Time, H or L
TCK to AOE1, BOE1 (Note 13)
tS
Setup Time, H or L
Internal AOE, BOE to TCK (Note 14)
5.0
3.0
5.0
4.5
5.0
3.0
3.0
ns
4.5
ns
3.0
ns
tH
Hold Time, H or L
TCK to Internal AOE, BOE (Note 14)
5.0
3.0
3.0
ns
tS
Setup Time
ACP, BCP (Note 15) to TCK
5.0
3.0
3.0
ns
tH
Hold Time
TCK to ACP, BCP (Note 15)
5.0
3.5
3.5
ns
tS
Setup Time, H or L
TMS to TCK
5.0
8.0
8.0
ns
tH
Hold Time, H or L
TCK to TMS
5.0
2.0
2.0
ns
tS
Setup Time, H or L
TDI to TCK
5.0
4.0
4.0
ns
tH
Hold Time, H or L
TCK to TDI
5.0
4.5
4.5
ns
tW
Pulse Width TCK
5.0
H
15.0
15.0
ns
L
5.0
5.0
fMAX
Maximum TCK
Clock Frequency
5.0
25
25
MHz
Tpu
Wait Time, Power Up to TCK
Tdn
Power Down Delay
Note 11: Voltage Range 5.0 is 5.0V ± 0.5V.
5.0
100
0.0
100
100
ns
100
ms
Note 12: This delay represents the timing relationship between the data Input and TCK at the associated scan cells numbered 0–8, 9–17, 18–26 and 27–35.
Note 13: Timing pertains to BSR 38 and 41 only.
Note 14: This delay represents the timing relationship between AOE, BOE and TCK at scan cells 36 and 39 only.
Note 15: Timing pertains to BSR 37 and 40 only.
Note: All Input Timing Delays involving TCK are measured from the rising edge of TCK.
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