71V016S15 Просмотр технического описания (PDF) - Integrated Device Technology

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71V016S15

3.3V CMOS Static RAM 1 Meg (64K x 16-Bit)

Integrated Device Technology 

IDT71V016, 3.3V CMOS Static RAM

1 Meg (64K x 16-Bit)

AC Test Conditions

Input Pulse Levels

Input Rise/Fall Times

Input Timing Reference Levels

Output Reference Levels

AC Test Load

GND to 3.0V

1.5ns

1.5V

1.5V

See Figure 1, 2 and 3

3211 tbl 09

Commercial and Industrial Temperature Ranges

AC Test Loads

IN NCEA DATAOUT

RT CE 16S NS 30pF*

3.3V

320Ω

350Ω

3211 drw 04

DATA OUT

5pF*

3.3V

320Ω

350Ω

3211 drw 05

PA LES71V0DESIG Figure 1. AC Test Load

*Including jig and scope capacitance.

Figure 2. AC Test Load

(for tCLZ, tOLZ, tCHZ, tOHZ, tOW, and tWHZ)

SODER EW 7

BR N •

6

O O R ∆tAA, tACS

(Typical, ns) 5

FO 4

3

•

•

2

•

1

•

•

•

8 20 40 60 80 100 120 140 160 180 200

CAPACITANCE (pF)

3211 drw 06

Figure 3. Output Capacitive Derating

6.442

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