HCC4097B Просмотр технического описания (PDF) - STMicroelectronics
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HCC4097B Datasheet PDF : 16 Pages
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HCC/HCF4067B HCC/HCF4097B
STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions)
Symbol
Parameter
IL
Quiescent
Supply
HCC
Current
types
HCF
types
SWITCH
RON On
Resistance
HCC
types
∆ON
HCF
types
Resistance ∆RON
(Between any two
channels)
Test Conditios
VIS
VEE VSS VDD
(V) (V) (V) (V)
5
10
15
20
5
10
15
0 ≤ VI
≤ VDD
0
5
0 10
15
0 ≤ VI
≤ VDD
0
5
0 10
15
5
0 0 10
15
TLOW *
Min. Max.
5
10
20
100
20
40
80
800
310
200
850
330
210
Value
25 oC
Min. Typ. Max.
0.04 5
0.04 10
0.04 20
0.08 100
0.04 20
0.04 40
0.04 80
470 1050
180 400
125 240
470 1050
180 400
125 240
10
10
5
THIGH *
Min. Max.
150
300
600
3000
150
300
600
1300
580
320
1200
520
300
OFF (•)
Channel
Leakage
Current
Any
HCC
Channel OFF types
All Channel
OFF
HCC
(common types
OUT/IN)
0 0 18
0 0 18
100
±0.1 100
1000
100
±0.1 100
1000
Any
HCF
Channel OFF types
0 0 15
300
±0.1 300
1000
All Channel
OFF
(common
OUT/IN)
HCF
types
0 0 15
300
±0.1 300
1000
C
Capacitance
Input
5
Output for 4067
-5 5
55
Output for 4097
35
Feedthrough
0.2
CONTROL
VIL Input Low
Voltage
VIH Input High
Voltage
= VDD VEE=VSS 5
1.5
thru RL =1KΩ 10
3
1KΩ
to VSS
15
4
IIS < 2µA 5 3.5
3.5
(on all OFF
channels) 10 7
7
15 11
11
1.5
1.5
3
3
4
4
3.5
7
11
IIH IIL Input
Leackage
HCC
types
VI = 0/18V
18
±0.1
±10-3 ±0.1
±1
Current
HCF
types
VI = 0/15V
15
±0.3
±10-3 ±0.3
±1
CI Input Capacitance Any Address or
Inhibit Input
5 7.5
• Determined by minimum feasible leakage measurement for automatic testing
* TLOW = -55 oC for HCC device: -40 oC for HCF device.
* THIGH = +125 oC for HCC device: +85 oC for HCF device.
The Noise Margin for both ”1” and ”0” level is: 1V min. with VDD = 5 V, 2 V min. with VDD = 10 V, 2.5 V min. with VDD = 15 V
Unit
µA
Ω
Ω
µA
pF
V
V
µA
pF
6/16
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