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WED3DL644V8BC Просмотр технического описания (PDF) - White Electronic Designs Corporation

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WED3DL644V8BC
WEDC
White Electronic Designs Corporation WEDC
WED3DL644V8BC Datasheet PDF : 28 Pages
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White Electronic Designs
WED3DL644V
Symbol
Type
CK
Input
CKE
Input
CE#
Input
RAS#, CAS#
WE#
Input
BA0,BA1
Input
A0-11,
A10/AP
Input
DQ
DQML0 - (DQ0-7)
DQMH0 - (DQ8-15)
DQML1 - (DQ16-23)
DQMH1 - (DQ24-31)
DQML2 - (DQ31-39)
DQMH2 - (DQ40-47)
DQML3 - (DQ48-55)
DQMH3 - (DQ56-63)
VCC, VSS
Input/Output
Input
Supply
INPUT/OUTPUT FUNCTIONAL DESCRIPTION
Signal
Pulse
Level
Pulse
Pulse
Level
Level
Level
Polarity Function
Positive Edge
The system clock input. All of the SDRAM inputs are sampled on the rising edge of the
clock.
Activates the CK signal when high and deactivates the CK signal when low. By
Active High deactivating the clock, CKE low initiates the Power Down mode, Suspend mode, or the
Self Refresh mode.
Active Low
CE# disable or enable device operation by masking or enabling all inputs except CK,
CKE and DQM.
Active Low
When sampled at the positive rising edge of the clock, CAS#, RAS#, and WE# define the
operation to be executed by the SDRAM.
Selects which SDRAM bank is to be active.
During a Bank Activate command cycle, A0-11 defines the row address (RA0-11) when
sampled at the rising clock edge.
During a Read or Write command cycle, A0-7 defines the column address (CA0-7) when
sampled at the rising clock edge. In addition to the row address, A10/AP is used to invoke
Autoprecharge operation at the end of the Burst Read or Write cycle. If A10/AP is high,
autoprecharge is selected and BA0, BA1 defines the bank to be precharged. If A10/AP is
low, autoprecharge is disabled.
During a Precharge command cycle, A10/AP is used in conjunction with BA0, BA1
to control which bank(s) to precharge. If A10/AP is high, all banks will be precharged
regardless of the state of BA0, BA1. If A10/AP is low, then BA0, BA1 is used to define
which bank to precharge.
Data Input/Output are multiplexed on the same pins
Pulse
Mask
Active High
The Data Input/Output mask places the DQ buffers in a high impedance state when
sampled high. In Read mode, DQM has a latency of two clock cycles and controls
the output buffers like an output enable. In Write mode, DQM has a latency of zero
and operates as a word mask by allowing input data to be written if it is low but blocks
the Write operation if DQM is high. Each DQM pin controls the byte in parentheses
associated with it.
Power and ground.
ABSOLUTE MAXIMUM RATINGS
Parameter
Symbol Min Max Units
Power Supply Voltage
VCC/VCCQ -1.0
+4.6
V
Input Voltage
VIN
-1.0 +4.6
V
Output Voltage
VOUT
-1.0
+4.6
V
Operating Temperature
tOPR
-40
+85
°C
Storage Temperature
tSTG
-55 +125
°C
Power Dissipation
PD
3.0
W
Short Circuit Output Current
IOS
50
mA
Stress greater than those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions greater than those indicated in the
operational sections of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
RECOMMENDED DC OPERATING CONDITIONS
(Voltage Referenced to: Vss = 0V)
Parameter
Symbol Min Typ Max Unit
Supply Voltage
VCC/VCCQ 3.0 3.3 3.6
V
Input High Voltage
VIH 2.0 3.0 VCC +0.3 V
Input Low Voltage
VIL -0.3 —
0.8
V
Output High Voltage (IOH =-2mA) VOH 2.4 —
V
Output Low Voltage (IOL = 2mA)
VOL — —
0.4
V
Input Leakage Voltage
IIL
-5 —
5
µA
Output Leakage Voltage
IOL -5 —
5
µA
CAPACITANCE
(TA = 25°C, f= 1MHZ, VCC = 3.3V)
Parameter
Symbol Max
Unit
Input Capacitance
CIN
8
pF
Input/Output Capacitance (DQ)
COUT
5
pF
August 2005
Rev. 6
3
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com

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