CP151D(1998) Просмотр технического описания (PDF) - STMicroelectronics
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CP151D Datasheet PDF : 7 Pages
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LCP1511D
FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT 1 : GO-NO GO TEST
R
VBAT =
- 48V
P
D.U.T.
Surge
generator
This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functional test circuit.
TEST PROCEDURE :
- Adjust the current level at the IH value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current : IPP = 10A, 10/1000µs.
- The D.U.T. will come back to the off-state within a duration of 50ms max.
TEST CIRCUIT 2 FOR VFP AND VDGL PARAMETERS
(V is defined in unload condition)
P
L
R2
VP
C1
R1
R4
R3
C2
TIP
R ING
G ND
Pulse (µs)
Vp
C1
C2
L
R1
R2
R3
R4
IPP
Rp
tr
tp
(V) (µF) (nF) (µH) (Ω) (Ω) (Ω) (Ω) (A) (Ω)
10 700 1500 20 200
0
50
15
25
25
30
10
1.2 50 1500 1
33
0
76
13
25
25
30
10
2
10 2500 10
0
1.1 1.3
0
3
3
38
62
4/7
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