VR28F010 Просмотр технического описания (PDF) - Intel
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VR28F010 Datasheet PDF : 22 Pages
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AC TESTING INPUT OUTPUT WAVEFORM
AC LOAD CIRCUIT
M28F010
271111 –7
AC Testing Inputs are driven at VOH1 for a logic ‘‘1’’ and VOL for
a logic ‘‘0’’ Testing measurements are made at VIH for a logic
‘‘1’’ and VIL for a logic ‘‘0’’ Rise Fall time s 10 ns
CL e 100 pF
CL includes Jig Capacitance
271111 – 8
AC TEST CONDITIONS
Input Rise and Fall Times (10% to 90%)
10 ns
Input Pulse Levels
Input Timing Reference Level
Output Timing Reference Level
VOL and VOH1
VIL and VIH
VIL and VIH
AC CHARACTERISTICS Read-Only Operations
Versions
M28F010-90 M28F010-12 M28F010-15 M28F010-20 M28F010-25 Unit
Symbol Characteristic Min Max Min Max Min Max Min Max Min Max
tAVAV tRC Read Cycle Time 90
tELQV tCE Chip Enable
Access Time
120
150
200
250
ns
90
120
150
200
250 ns
tAVQV tACC Address Access
Time
90
120
150
200
250 ns
tGLQV tOE Output Enable
Access Time
40
50
55
60
65 ns
tELQX tLZ Chip Enable to
0
0
0
0
0
ns
Output in Low Z
tGLQX tOLZ Output Enable to 0
0
0
0
0
ns
Output in Low Z
tGHQZ tDF Output Disable to
30
30
35
45
60 ns
Output in High Z
tOH
Output Hold from
Address CE
0
0
0
0
0
ns
or OE Change(1)
tWHGL
Write Recovery
6
6
6
6
6
ms
Time before Read
NOTE
1 Whichever occurs first
15
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