CY7C1041BNV33(2011) Просмотр технического описания (PDF) - Cypress Semiconductor
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CY7C1041BNV33 Datasheet PDF : 14 Pages
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CY7C1041BNV33
Maximum Ratings
Exceeding the maximum ratings may impair the useful life of the
device. These user guidelines are not tested.
Storage Temperature ................................ –65 °C to +150 °C
Ambient Temperature with
Power Applied .......................................... –55 °C to +125 °C
Supply Voltage on VCC to Relative GND[1] ...–0.5 V to +4.6 V
DC Voltage Applied to Outputs
in High Z State[1].................................. –0.5 V to VCC + 0.5 V
DC Input Voltage[1] .............................. –0.5 V to VCC + 0.5 V
Current into Outputs (LOW)......................................... 20 mA
Operating Range
Range
Commercial
TemApmebraietunrte[2]
0 °C to +70 °C
VCC
3.3 V ± 0.3 V
Electrical Characteristics
Over the Operating Range
Parameter
Description
Test Conditions
VOH
Output HIGH Voltage
VCC = Min, IOH = –4.0 mA
VOL
Output LOW Voltage
VCC = Min, IOL = 8.0 mA
VIH
Input HIGH Voltage
VIL
Input LOW Voltage[1]
IIX
Input Leakage Current
GND < VI < VCC
IOZ
Output Leakage Current
GND < VOUT < VCC, Output Disabled
ICC
VCC Operating Supply Current
VCC = Max., f = fMAX = 1/tRC
Commercial
ISB1
Automatic CE Power-Down Current Max. VCC, CE > VIH, VIN > VIH or VIN < VIL, f = fMAX
—TTL Inputs
ISB2
Automatic CE Power-Down Current Max. VCC, CE > VCC – 0.3V,
Commercial
—CMOS Inputs
VIN > VCC – 0.3V, or VIN < 0.3V, f = 0
-12
Unit
Min
Max
2.4
–
V
–
0.4
V
2.2 VCC + 0.5 V
–0.5
0.8
V
–1
+1
mA
–1
+1
mA
–
190
mA
–
40
mA
–
0.5
mA
Capacitance[3]
Parameter
CIN
COUT
Description
Input Capacitance
I/O Capacitance
Test Conditions
TA = 25 °C, f = 1 MHz, VCC = 3.3 V
Max
Unit
8
pF
8
pF
AC Test Loads and Waveforms
3.3 V
OUTPUT
30 pF
INCLUDING
JIG AND
SCOPE
R1 317
(a)
THÉVENIN EQUIVALENT
OUTPUT
167
R2
(b)
351
3.3 V
1.73 V
GND
Rise time: 1 V/ns
ALL INPUT PULSES
90%
10%
90%
10%
Fall time:
1 V/ns
Notes
1. VIL (min.) = –2.0 V for pulse durations of less than 20 ns.
2. TA is the “Instant On” case temperature.
3. Tested initially and after any design or process changes that may affect these parameters.
Document #: 001-06434 Rev. *C
Page 4 of 14
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