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SCY99080CDWR2G Просмотр технического описания (PDF) - ON Semiconductor

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SCY99080CDWR2G Datasheet PDF : 27 Pages
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DDA002C
Figure 59. Recommended Layout for DDA002C Device
Maximum Substrate Charge Measurements
This chapter refers to Qmax parameter measurements.
The DDA002C has been connected according to the
Figure 60 during Qmax measurements. This connection
allows measuring just only the substrate current that flows
during the L1 demagnetization. Once the current is
integrated one can get maximum charge that can flow to the
substrate without causing device malfunction. Measure
ments didn’t show that the Qmax depends on the operating
frequency of the device. Measurements have been done for
TA = 125°C.
Figure 60. Substrate Injection Measurements Schematic
Ordering Information
DELTA device
ON Semiconductor Device
Package
Shipping[
DDA002C
SCY99080CDWR2G
SOIC19WB
(PbFree)
1000 / Tape & Reel
[For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specification Brochure, BRD8011/D.
http://onsemi.com
26

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