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5962-9318705H4X Просмотр технического описания (PDF) - Microsemi Corporation

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5962-9318705H4X
Microsemi
Microsemi Corporation Microsemi
5962-9318705H4X Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
WS128K32-XXX
Parameter
Read Cycle
Symbol
Read Cycle Time
tRC
Address Access Time
tAA
Output Hold from Address Change
tOH
Chip Select Access Time
tACS
Output Enable to Output Valid
tOE
Chip Select to Output in Low Z
tCLZ1
Output Enable to Output in Low Z
tOLZ1
Chip Disable to Output in High Z
tCHZ1
Output Disable to Output in High Z
tOHZ1
1. This parameter is guaranteed by design but not tested.
AC CHARACTERISTICS
VCC = 5.0V, GND = 0V, -55°C TA +125°C
-15
Min Max
15
15
0
15
10
3
0
12
12
-17
Min Max
17
17
0
17
10
3
0
12
12
-20
Min Max
20
20
0
20
12
3
0
12
12
-25
Min Max
25
25
0
25
15
3
0
12
12
-35
Min Max
35
35
0
35
20
3
0
15
15
-45
Min Max
45
45
0
45
25
3
0
20
20
-55
Min Max
55
55
0
55
30
3
0
20
20
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
Parameter
Symbol
Write Cycle
Write Cycle Time
tWC
Chip Select to End of Write
tCW
Address Valid to End of Write
tAW
Data Valid to End of Write
tDW
Write Pulse Width
tWP
Address Setup Time
tAS
Address Hold Time
tAH
Output Active from End of Write
tOW1
Write Enable to Output in High Z
tWHZ1
Data Hold Time
tDH
1. This parameter is guaranteed by design but not tested.
AC CHARACTERISTICS
VCC = 5.0V, GND = 0V, -55°C TA +125°C
-15
-17
-20
-25
Min Max Min Max Min Max Min Max
15
17
20
25
14
14
15
20
14
15
15
20
10
10
12
15
14
14
15
20
0
0
0
0
0
0
0
0
3
3
3
3
10
10
12
15
0
0
0
0
-35
Min Max
35
25
25
20
25
0
0
4
20
0
-45
Min Max
45
30
30
25
30
0
0
4
25
0
-55
Min Max
55
45
45
25
45
0
0
4
25
0
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
FIGURE. 4 – AC TEST CIRCUIT
AC Test Conditions
Parameter
Input Pulse Levels
Input Rise and Fall
Input and Output Reference Level
Output Timing Reference Level
Typ
Unit
VIL = 0, VIH = 3.0
V
5
ns
1.5
V
1.5
V
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
Microsemi Corporation reserves the right to change products or specications without notice.
September 2010 © 2010 Microsemi Corporation. All rights reserved.
4
Rev. 18
Microsemi Corporation • (602) 437-1520 • www.whiteedc.com
www.microsemi.com

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