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AD8191A Просмотр технического описания (PDF) - Analog Devices

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AD8191A Datasheet PDF : 28 Pages
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ABSOLUTE MAXIMUM RATINGS
Table 2.
Parameter
AVCC to AVEE
DVCC to DVEE
DVEE to AVEE
VTTI
VTTO
AMUXVCC
Internal Power Dissipation
High Speed Input Voltage
High Speed Differential Input Voltage
Low Speed Input Voltage
I2C® and Parallel Logic Input Voltage
Storage Temperature Range
Operating Temperature Range
Junction Temperature
Rating
3.7 V
3.7 V
±0.3 V
AVCC + 0.6 V
AVCC + 0.6 V
5.5 V
2.2 W
AVCC − 1.4 V < VIN <
AVCC + 0.6 V
2.0 V
DVEE − 0.3 V < VIN <
AMUXVCC + 0.6 V
DVEE − 0.3 V < VIN <
DVCC + 0.6 V
−65°C to +125°C
−40°C to +85°C
150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
AD8191A
THERMAL RESISTANCE
θJA is specified for the worst-case conditions: a device soldered
in a 4-layer JEDEC circuit board for surface-mount packages.
θJC is specified for no airflow.
Table 3. Thermal Resistance
Package Type
θJA
θJC
Unit
100-Lead LQFP
56
19
°C/W
MAXIMUM POWER DISSIPATION
The maximum power that can be safely dissipated by the
AD8191A is limited by the associated rise in junction
temperature. The maximum safe junction temperature for
plastic encapsulated devices is determined by the glass
transition temperature of the plastic, approximately 150°C.
Temporarily exceeding this limit may cause a shift in
parametric performance due to a change in the stresses exerted
on the die by the package.
Exceeding a junction temperature of 175°C for an extended
period can result in device failure. To ensure proper operation, it is
necessary to observe the maximum power rating as determined by
the coefficients in Table 3.
ESD CAUTION
Rev. 0 | Page 5 of 28

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