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IDT71V256SA Просмотр технического описания (PDF) - Integrated Device Technology

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IDT71V256SA
IDT
Integrated Device Technology IDT
IDT71V256SA Datasheet PDF : 6 Pages
1 2 3 4 5 6
IDT71V256SA
3.3V CMOS STATIC RAM 256K (32K x 8-BIT)
INDUSTRIAL AND COMMERCIAL TEMPERATURE RANGES
AC ELECTRICAL CHARACTERISTICS (VCC = 3.3V ± 0.3V)
71V256SA10(2) 71V256SA12(2) 71V256SA15
Symbol
Parameter
Max. Min. Min. Max. Min. Max.
Read Cycle
tRC
Read Cycle Time
10
12
15
tAA
Address Access Time
10
12
15
tACS
tCLZ(1)
tCHZ(1)
Chip Select Access Time
Chip Select to Output in Low-Z
Chip Select to Output in High-Z
10
5
0
8
12
15
5
5
0
8
0
9
tOE
tOLZ(1)
tOHZ(1)
Output Enable to Output Valid
Output Enable to Output in Low-Z
Output Disable to Output in High-Z
6
3
2
6
6
7
3
0
2
6
0
7
tOH
Output Hold from Address Change
3
3
3
Write Cycle
tWC
Write Cycle Time
10
12
15
tAW
Address Valid to End-of-Write
9
9
10
tCW
Chip Select to End-of-Write
9
9
10
tAS
Address Set-up Time
0
0
0
tWP
Write Pulse Width
9
9
10
tWR
Write Recovery Time
0
0
0
tDW
Data to Write Time Overlap
6
6
7
tDH
tOW(1)
tWHZ(1)
Data Hold from Write Time
Output Active from End-of-Write
Write Enable to Output in High-Z
0
4
1
8
0
0
4
4
1
8
1
9
NOTE:
1. This parameter guaranteed with the AC test load (Figure 2) by device characterization, but is not production tested.
2. Commercial temperature range only.
71V256SA20(2)
Min. Max. Unit
20
ns
20
ns
20
ns
5
ns
0
10
ns
8
ns
0
ns
0
8
ns
3
ns
20
ns
15
ns
15
ns
0
ns
15
ns
0
ns
8
ns
0
ns
4
ns
1
10
ns
3101 tbl 10
TIMING WAVEFORM OF READ CYCLE NO. 1(1)
t RC
ADDRESS
tAA
OE
CS
DATAOUT
tOE
t OLZ (2)
tACS
t CLZ (2)
NOTES:
1. WE is HIGH for Read cycle.
2. Transition is measured ±200mV from steady state.
tOH
t OHZ (2)
t CHZ (2)
DATA VALID
3101 drw 06
4

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