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ADIS16136AMLZ(RevD) Просмотр технического описания (PDF) - Analog Devices

Номер в каталоге
Компоненты Описание
производитель
ADIS16136AMLZ
(Rev.:RevD)
ADI
Analog Devices ADI
ADIS16136AMLZ Datasheet PDF : 20 Pages
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Data Sheet
ADIS16136
SPECIFICATIONS
TA = 25°C, VDD = 5.0 V, angular rate = 0°/sec, dynamic range = ±450°/sec, ±1 g, unless otherwise noted.
Table 1.
Parameter
GYROSCOPES
Dynamic Range
Sensitivity
Repeatability1
Sensitivity Temperature Coefficient
Nonlinearity
Bias Repeatability1, 2
Bias Temperature Coefficient
In-Run Bias Stability
Angular Random Walk
Linear Acceleration Effect on Bias
Bias Voltage Sensitivity
Misalignment
Output Noise
Rate Noise Density
3 dB Bandwidth
Sensor Resonant Frequency
LOGIC INPUTS3
Input High Voltage, VIH
Input Low Voltage, VIL
Logic 1 Input Current, IIH
Logic 0 Input Current, IIL
All Pins Except RST
RST Pin
Input Capacitance, CIN
DIGITAL OUTPUTS3
Output High Voltage, VOH
Output Low Voltage, VOL
FLASH MEMORY
Data Retention4
FUNCTIONAL TIMES5
Power-On Start-Up Time
Reset Recovery Time
Sleep Mode Recovery Time
Flash Memory Update
Flash Memory Self Test
Automatic Sensor Self Test Time
SAMPLE RATE
Internal Sample Rate Accuracy
Input Sync Clock Range
POWER SUPPLY
Power Supply Current
Test Conditions/Comments
GYRO_OUT, GYRO_OUT2 (24 bits)
−40°C ≤ TA ≤ +70°C
−40°C ≤ TA ≤ +70°C, 1 σ
Best fit straight line, ±400°/sec
−40°C ≤ TA ≤ +70°C, 1 σ
−40°C ≤ TA ≤ +70°C, 1 σ
25°C, SMPL_PRD = 0x000F
1 σ, 25°C
VDD = 4.75 V to 5.25 V, 1 σ
Axis-to-frame (package)
No filtering
f = 25 Hz, no filtering
VIH = 3.3 V
VIL = 0 V
ISOURCE = 1.6 mA
ISINK = 1.6 mA
Endurance4
TJ = 85°C
Time until data is available
SMPL_PRD ≠ 0x0000
SMPL_PRD = 0x000F
SMPL_PRD = 0x0000
Operating voltage range, VDD
SMPL_PRD = 0x001F
Sleep mode
Min
±450
15.5
2.0
2.4
10,000
20
6806
680 6
4.75
Typ
7.139x10−5
±35
±0.01
±0.15
±0.00125
4
0.167
0.017
±0.08
±1.0
0.11
0.00357
380
17.5
±0.2
40
80
10
245
128
2.5
72
21
245
5.0
120
1.4
Max
±480
±1
20
0.8
±1
60
0.4
2048
±3
2048
5.25
Unit
°/sec
°/sec/LSB
%
ppm/°C
% of FS
°/sec
°/sec/°C
°/hr
°/√hr
°/sec/g
°/sec/V
Degrees
°/sec rms
°/sec/√Hz rms
Hz
kHz
V
V
µA
μA
μA
pF
V
V
Cycles
Years
ms
ms
ms
ms
ms
ms
SPS
%
Hz
V
mA
mA
1 The Repeatability specifications represent analytical projections, which are based off of the following drift contributions and conditions: temperature hysteresis (−40°C
to +70°C), electronics drift (High-Temperature Operating Life test: +85°C, 500 hours), drift from temperature cycling (JESD22, Method A104-C, Method N, 500 cycles,
−40°C to +85°C), rate random walk (10 year projection), and broadband noise
2 Bias repeatability describes a long-term behavior, over a variety of conditions. Short-term repeatability is related to the in-run bias stability and noise density specifications.
3 The digital I/O signals are driven by an internal 3.3 V supply, and the inputs are 5 V tolerant.
4 JEDEC Standard 22, Method A117. Endurance measured at −40°C, +25°C, +85°C, and +125°C.
5 These times do not include thermal settling and internal filter response times, which may affect overall accuracy.
6 The sync input clock and internal sampling clock function below the specified minimum value, at reduced performance levels.
Rev. D | Page 3 of 20

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