MAL215919331E3 Просмотр технического описания (PDF) - Vishay Semiconductors
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MAL215919331E3 Datasheet PDF : 10 Pages
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159 PUL-SI
Vishay BCcomponents
Table 5
TEST PROCEDURES AND REQUIREMENTS
TEST
NAME OF TEST
REFERENCE
PROCEDURE
(quick reference)
REQUIREMENTS
Endurance
Load life
Useful life
IEC 60384-4 /
EN130300
subclause 4.13
CECC 30301
subclause 1.8.1
Tamb = 105 C; UR applied; 2000 h
Tamb = 105 C; UR and IR applied; 2000 h
Tamb = 105 C; UR and IR applied;
5000 h
C/C: ± 15 %
ESR 1.3 x spec. limit
IL5 spec. limit
C/C: ± 20 %
ESR 2 x spec. limit
IL5 spec. limit
C/C: ± 30 %
ESR 3 x spec. limit
IL5 spec. limit
total failure percentage: 3 %
Shelf life
(storage at
high temperature)
IEC 60384-4 /
EN130300
subclause 4.17
Tamb = 105 C; no voltage applied; 1000 h
after test: UR to be applied for 30 min,
24 h to 48 h before measurement
C/C: ± 15 %
ESR 1.5 x spec. limit
IL5 spec. limit
Statements about product lifetime are based on calculations and internal testing. They should only be interpreted as estimations. Also due to external factors, the
lifetime in the field application may deviate from the calculated lifetime. In general, nothing stated herein shall be construed as a guarantee of durability.
Revision: 31-Jan-17
8
Document Number: 28341
For technical questions, contact: aluminumcaps2@vishay.com
THIS DOCUMENT IS SUBJECT TO CHANGE WITHOUT NOTICE. THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT
ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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