74ABT20 Просмотр технического описания (PDF) - NXP Semiconductors.

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74ABT20

Dual 4-input NAND gate

NXP Semiconductors. 

Nexperia

74ABT20

Dual 4-input NAND gate

10. Dynamic characteristics

Table 7. Dynamic characteristics

GND = 0 V; for test circuit, see Figure 7.

Symbol Parameter

Conditions

tPLH

tPHL

tsk(o)

LOW to HIGH

propagation delay

HIGH to LOW

propagation delay

output skew time

nA, nB, nC, nD to nY;

see Figure 6

nA, nB, nC, nD to nY;

see Figure 6

25 C; VCC = 5.0 V

Min Typ Max

1.0 2.7 3.9

40 C to +85 C; Unit

VCC = 5.0 V  0.5 V

Min

Max

1.0

4.6 ns

1.0 2.2 3.4

1.0

3.8 ns

[1]

-

0.3 0.5

-

0.5 ns

[1] Skew between any two outputs of the same package switching in the same direction. This parameter is guaranteed by design.

11. Waveforms

9,

Q$Q%Q&

Q'LQSXW

*1'

92+

Q<RXWSXW

92/

90

W3+/

90

W3/+

DDD

Fig 6.

VM = 1.5 V

VOL and VOH are typical output voltage levels that occur with the output load.

Propagation delay input (nA, nB, nC, nD) to output (nY) and output skew time

74ABT20

Product data sheet

All information provided in this document is subject to legal disclaimers.

Rev. 3 — 12 August 2016

© Nexperia B.V. 2017. All rights reserved

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