HCF4070YM013TR Просмотр технического описания (PDF) - STMicroelectronics
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HCF4070YM013TR Datasheet PDF : 12 Pages
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Device overview
HCF4070
Symbol
Table 7. Dynamic electrical characteristics
(Tamb = 25 °C, CL = 50 pF, RL = 200 kΩ, tr = tf = 20 ns)
Parameter
Test condition
Value(1)
VDD (V)
Min. Typ. Max.
Unit
5
140 280
tPLH tPHL Propagation delay time
10
15
70
130
ns
50
100
5
100 200
tTLH tTHL Output transition time
10
50
100
ns
15
40
80
1. Typical temperature coefficient for all VDD values is 0.3%/°C.
Figure 4. Test circuit
1. CL = 50 pF or equivalent (includes jig and probe capacitance)
2. RL = 200 k
3. RT = ZOUT of pulse generator (typically 50 )
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DocID002061 Rev 5
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