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IGP10N60T Просмотр технического описания (PDF) - Infineon Technologies

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IGP10N60T Datasheet PDF : 12 Pages
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IGP10N60T
TRENCHSTOPSeries
q
1 ,0 m J
*) Eon and Etsinclude losses
due to diode recovery
0 ,8 m J
0 ,6 m J
0 ,4 m J
0 ,2 m J
Ets*
E off
0,8 mJ
*) Eon and Ets include losses
due to diode recovery
0,6 mJ
Eon*
0,4 mJ
0,2 mJ
Ets*
E off
Eon*
0 ,0 m J
0A
5A
10A
15A
IC, COLLECTOR CURRENT
Figure 13. Typical switching energy losses
as a function of collector current
(inductive load, TJ = 175°C,
VCE = 400V, VGE = 0/15V, rG = 23Ω,
Dynamic test circuit in Figure E)
0,0 mJ





RG, GATE RESISTOR
Figure 14. Typical switching energy losses
as a function of gate resistor
(inductive load, TJ = 175°C,
VCE = 400V, VGE = 0/15V, IC = 10A,
Dynamic test circuit in Figure E)
0 ,6 m J
*) Eon and Ets include losses
due to diode recovery
0 ,5 m J
Ets*
0 ,4 m J
0,3mJ Eoff
0 ,2 m J
E*
0,1mJ on
0 ,0 m J
50°C
100°C
150°C
TJ, JUNCTION TEMPERATURE
Figure 15. Typical switching energy losses
as a function of junction
temperature
(inductive load, VCE = 400V,
VGE = 0/15V, IC = 10A, rG = 23Ω,
Dynamic test circuit in Figure E)
0 ,8 m J
*) Eon and Ets include losses
due to diode recovery
0 ,6 m J
Ets*
0 ,4 m J
E off
0 ,2 m J
Eon*
0 ,0 m J
300V 350V 400V 450V 500V 550V
VCE, COLLECTOR-EMITTER VOLTAGE
Figure 16. Typical switching energy losses
as a function of collector emitter
voltage
(inductive load, TJ = 175°C,
VGE = 0/15V, IC = 10A, rG = 23Ω,
Dynamic test circuit in Figure E)
IFAG IPC TD VLS
7
Rev. 2.5 30.04.2015

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