WSF2816-39G2UX Просмотр технического описания (PDF) - White Electronic Designs Corporation
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WSF2816-39G2UX Datasheet PDF : 15 Pages
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White Electronic Designs
WSF2816-39XX
SRAM AC CHARACTERISTICS
VCC = 5.0V, -55°C ≤ TA ≤ +125°C
Parameter
Read Cycle
Read Cycle Time
Address Access Time
Output Hold from Address Change
Chip Select Access Time
Output Enable to Output Valid
Chip Select to Output in Low Z
Output Enable to Output in Low Z
Chip Disable to Output in High Z
Output Disable to Output in High Z
-35
Symbol
Unit
Min Max
tRC
35
ns
tAA
35 ns
tOH
0
ns
tACS
35 ns
tOE
20 ns
tCLZ1
3
ns
tOLZ1
0
ns
tCHZ1
20 ns
tOHZ1
20 ns
1. This parameter is guaranteed by design but not tested.
SRAM AC CHARACTERISTICS
VCC = 5.0V, -55°C ≤ TA ≤ +125°C
Parameter
Write Cycle
Write Cycle Time
Chip Select to End of Write
Address Valid to End of Write
Data Valid to End of Write
Write Pulse Width
Address Setup Time
Address Hold Time
Output Active from End of Write
Write Enable to Output in High Z
Data Hold from Write Time
-35
Symbol
Unit
Min Max
tWC
35
ns
tCW
25
ns
tAW
25
ns
tDW
20
ns
tWP
25
ns
tAS
0
ns
tAH
0
ns
tOW1
4
ns
tWHZ1
20 ns
tDH
0
ns
1. This parameter is guaranteed by design but not tested.
FIGURE 3
AC Test Circuit
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
≈
Output Timing Reference Level
1.5
V
Notes: VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75Ω.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
White Electronic Designs Corp. reserves the right to change products or specifications without notice.
May 2003
Rev. 6
4
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com
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