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IRM-3636AF4 Просмотр технического описания (PDF) - EVERLIGHT

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IRM-3636AF4 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
EVERLIGHT ELECTRONICS CO.,LTD.
IRM-36xxAF4 SERIES
Reliability Test Item And Condition
The reliability of products shall be satisfied with items listed below.
Confidence level: 90%
LTPD: 10%
Test Items
Test Conditions
Temperature cycle
1 cycle -40+25+85
(30min)(5min)(30min)
300 cycle test
Temp: +85
High temperature test Vcc:5V
1000hrs
Low temperature
storage
Temp: -40
1000hrs
High temperature
High humidity
Ta: 85,RH: 85%
1000hrs
Failure Judgement
Criteria
Samples(n)
Defective(c)
n=22,c=0
L0L×0.8
L45L×0.8
n=22,c=0
n=22,c=0
L: Lower specification
limit
n=22,c=0
Solder heat
Temp: 260±510sec
4mm From the bottom of the package.
n=22,c=0
Everlight Electronics Co., Ltd.
Device NoDMO-036-325
http:\\www.everlight.com
Prepared date07-20-2005
Rev 2
Page: 8 of 9
Prepared byCarryll Hsu

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