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PI49FCT807CTQE Просмотр технического описания (PDF) - Pericom Semiconductor

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PI49FCT807CTQE
Pericom-Semiconductor
Pericom Semiconductor Pericom-Semiconductor
PI49FCT807CTQE Datasheet PDF : 7 Pages
1 2 3 4 5 6 7
PI49FCT807/2807T
Fast CMOS Clock Driver 1122334455667788990011223344556677889900112233445566778899001122112233445566778899001122334455667788990011223344556677889900112211223344556677889900112233445566778899001122334455667788990011221122334455667788990011223344556677889900112233445566778899001122112233445566778899001122
Maximum Ratings
(Above which the useful life may be impaired. For user guidelines, not tested.)
Storage Temperature ........................................................... –65°C to +150°C
Ambient Temperature with Power Applied ............................ -40°C to +85°C
Supply Voltage to Ground Potential (Inputs & Vcc Only) ..... –0.5V to +7.0V
Supply Voltage to Ground Potential (Outputs & D/O Only) .. –0.5V to +7.0V
DC Input Voltage .................................................................. –0.5V to +7.0V
DC Output Current ............................................................................. 120mA
Note:
Stresses greater than those listed under MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at
these or any other conditions above those indicated in the
operational sections of this specification is not implied.
Exposure to absolute maximum rating conditions for ex-
tended periods may affect reliability.
Power Dissipation .................................................................................. 0.5W
DC Electrical Characteristics (Over the Operating Range, TA = –40°C to +85°C, VCC = 5.0V ± 5%)
Parameters Description
Test Conditions(1)
Min.
VOH
Output HIGH Voltage VCC = Min., VIN = VIH or VIL
IOH = –15.0mA
2.4
IOH = 48.0mA
VOL
Output LOW Current VCC = Min., VIN = VIH or VIL
IOL = 12mA(25)
VIH
Input HIGH Voltage Guaranteed Logic HIGH Level
2.0
VIL
Input LOW Voltage Guaranteed Logic LOW Level
IIH
Input HIGH Current VCC = Max.
VIN = 2.7V
IIL
Input LOW Current
VCC = Max.
VIN = 0.5V
II
Input HIGH Current VCC = Max., VIN =VCC (Max.)
VIK
Clamp Diode Voltage VCC = Min., IIN = –18mA
IOS
Short Circuit Current VCC = Max.(3), VOUT = GND
–60
IOFF
Power Down Disable VCC=GND, VOUT =4.5V
VH
Input Hysteresis
Typ.(2)
3.3
0.2
0.2
–0.7
–120
150
Max.
0.5
0.5
0.8
1
–1
20
–1.2
–225
100
Units
V
V
V
V
V
µA
µA
µA
V
mA
µA
mV
Capacitance (TA = 25°C, f = 1 MHz)
Parameters(4) Description
Test Conditions
Typ.
Max.
CIN
Input Capacitance
VIN = 0V
6.0
10
COUT
Output Capacitance
VOUT = 0V
8
12
Notes:
1. For Max. or Min. conditions, use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at Vcc = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the test should not exceed one second.
4. This parameter is determined by device characterization but is not production tested.
Units
pF
pF
2
PS7008D 09/24/04

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