LCDP1511D Просмотр технического описания (PDF) - STMicroelectronics
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LCDP1511D Datasheet PDF : 6 Pages
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LCDP1511D
FUNCTIONAL HOLDING CURRENT (IH) TEST CIRCUIT : GO-NO GO TEST
R
VBAT = - 48 V
D.U.T.
- VP
Surge generator
This is a GO-NO GO test which allows to confirm the holding current (IH) level in a functionaltest circuit.
TEST PROCEDURE :
- Adjust the current level at the IH value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current : IPP = 15A, 10/1000µs.
- The D.U.T. will come back to the off-state within a duration of 50ms max.
TEST CIRCUIT FOR VFP AND VDGL PARAMETERS
(V is defined in unload condition)
P
L
R2
VP
C1
R1
R4
R3
C2
TIP
RING
G ND
Pulse (µs)
Vp
C1
C2
L
R1
R2
R3
R4
IPP
Rp
tr
tp
(V) (µF) (nF) (µH) (Ω) (Ω) (Ω) (Ω) (A) (Ω)
10 700 1000 20 200
0
50
15
25
25
10
60
1.2 50 1500 1
33
0
76
13
25
25
15
60
2
10 2500 10
0
1.1 1.3
0
3
3
10 245
4/6
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