HEC4007UBDB Просмотр технического описания (PDF) - Philips Electronics

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HEC4007UBDB

Dual complementary pair and inverter

Philips Electronics 

Philips Semiconductors

Dual complementary pair and inverter

Product specification

HEF4007UB

gates

Fig.9 Test set-up for measuring forward transconductance gfs = dio/dvi at vo is constant (see also graph Fig.10).

A: average,

B: average + 2 s,

C: average − 2 s, in where ‘s’ is the observed standard deviation.

Fig.10 Typical forward transconductance gfs as a function of the supply voltage at Tamb = 25 °C.

January 1995

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