IDT6178S25DB Просмотр технического описания (PDF) - Integrated Device Technology
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IDT6178S25DB Datasheet PDF : 7 Pages
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IDT6178S
CMOS StaticRAM 16K (4K x 4-BIT) CACHE-TAG RAM
MILITARY AND COMMERCIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS (VCC = 5.0V ± 10%, All Temperature Ranges)
6178S
Symbol
Parameter
Test Condition
Min.
|ILI|
Input Leakage Current
VCC = 5.5V, VIN = 0V to VCC
—
|ILO|
Output Leakage Current
OE = VIH, VOUT = 0V to VCC
—
VOL
Output Low Voltage
IOL = 8mA (I/O0 – I/O3)
—
IOL = 10mA (I/O0 – I/O3)
—
IOL = 16mA (Match)
—
IOL = 20mA (Match)
—
VOH
Output High Voltage
IOH = –4mA (I/O0 – I/O3)
2.4
IOH = –8mA (Match)
2.4
Max.
10
10
0.4
0.5
0.4
0.5
—
—
DC ELECTRICAL CHARACTERISTICS (VCC = 5.0V ± 10%, All Temperature Ranges)
Symbol
Parameter
6178S10
Max.
6178S12(1)
Max.
6178S15(1)
Max.
ICC1 Operating Power Supply Current
COM'L.
90
90
90
Outputs Open, VCC = Max., f = 0(2) MIL.
—
110
110
ICC2 Dynamic Operating Current
COM'L. 180
160
140
Outputs Open, VCC = Max., f = fMAX(2) MIL.
—
180
160
NOTES:
1. Military values are preliminary only.
2. fMAX = 1/tRC, only address inputs are cycling at fMAX. f = 0 means no address inputs change.
6178S20/25
Max.
90
110
140
160
Unit
µA
µA
V
V
V
V
V
V
2953 tbl 07
Unit
mA
mA
mA
mA
2953 tbl 08
AC TEST CONDITIONS
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Reference Levels
AC Test Load
AC Test Load for Match Cycle
GND to 3.0V
5ns
1.5V
1.5V
See Figures 2 and 3
See Figure 1
2953 tbl 09
MATCHOUT
128Ω
+5V
240Ω
30pF*
2953 drw 04
Figure 1. AC Test Load for MATCH
+5V
+5V
DATAOUT
255Ω
480Ω
30pF*
DATAOUT
255Ω
480Ω
5pF*
2953 drw 05
Figure 2. AC Test Load
* Including scope and jig.
11.1
2953 drw 06
Figure 3. AC Test Load
(for tOLZ, tOHZ, tWHZ, tOW)
3
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