TD62785FG Просмотр технического описания (PDF) - Toshiba

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TD62785FG

TOSHIBA BIPOLAR DIGITAL INTEGRATED CIRCUIT SILICON MONOLITHIC

Toshiba 

Test Circuit

1. VIH, VIL, ICC

3. VCE (sat)

4. tON, tOFF

2. IIL

TD62785PG/FG

Note 1: Pulse width 50 µs, duty cycle 10%

Output impedance 50 Ω, tr ≤ 5 ns, tf ≤ 10 ns

Note 2: CL includes probe and jig capacitance

Precautions for Using

This IC does not integrate protection circuits such as overcurrent and overvoltage protectors.

Thus, if excess current or voltage is applied to the IC, the IC may be damaged. Please design the IC so that

excess current or voltage will not be applied to the IC.

Utmost care is necessary in the design of the output line, VCC and GND line since IC may be destroyed due to

short−circuit between outputs, air contamination fault, or fault by improper grounding.

4

2006-06-14

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