TC74ACT157FN Просмотр технического описания (PDF) - Toshiba

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TC74ACT157FN

TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic

Toshiba 

Operating Ranges (Note)

TC74ACT157P/F/FN/FT

Characteristics

Symbol

Rating

Unit

Supply voltage

Input voltage

Output voltage

Operating temperature

Input rise and fall time

VCC

VIN

VOUT

Topr

dt/dV

4.5 to 5.5

0 to VCC

0 to VCC

−40 to 85

0 to 10

V

V

V

°C

ns/V

Note: The operating ranges must be maintained to ensure the normal operation of the device.

Unused inputs must be tied to either VCC or GND.

Electrical Characteristics

DC Characteristics

Characteristics

Symbol

High-level input

voltage

VIH

Test Condition

―

Ta = 25°C

Ta =

−40 to 85°C

Unit

VCC

(V)

Min

Typ.

Max

Min

Max

4.5

to 2.0

―

―

2.0

―

V

5.5

Low-level input

voltage

VIL

4.5

―

to ―

―

0.8

―

0.8

V

5.5

High-level output

voltage

Low-level output

voltage

Input leakage

current

VOH

VOL

IIN

VIN

IOH = −50 μA

4.5 4.4 4.5

―

4.4

―

= VIH or IOH = −24 mA

4.5 3.94 ―

― 3.80 ―

V

VIL

IOH = −75 mA (Note) 5.5 ―

―

― 3.85 ―

VIN

IOH = 50 μA

4.5 ―

0.0 0.1

―

0.1

= VIH or IOH = 24 mA

4.5 ―

― 0.36

― 0.44

V

VIL

IOH = 75 mA (Note) 5.5 ―

―

―

― 1.65

VIN = VCC or GND

5.5 ―

― ±0.1 ― ±1.0 μA

Quiescent supply

current

ICC

VIN = VCC or GND

Per input: VIN = 3.4 V

IC

Other input: VCC or GND

5.5 ―

5.5 ―

―

8.0

― 80.0 μA

― 1.35 ―

1.5 mA

Note:

This spec indicates the capability of driving 50 Ω transmission lines.

One output should be tested at a time for a 10 ms maximum duration.

4

2007-10-01

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