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TC58DVM92A1FT00

TENTATIVE TOSHIBA MOS DIGITAL INTEGRATED CIRCUIT SILICON GATE CMOS

Toshiba 

TC58DVM92A1FT00

Note: (1) CE High to Ready time depends on the pull-up resistor tied to the RY/BY pin.

(Refer to Application Note (9) toward the end of this document.)

(2) Sequential Read is terminated when tCEH is greater than or equal to 100 ns. If the RE to CE delay

is less than 30 ns, RY/BY signal stays Ready.

tCEH t 100 ns

*

*: VIH or VIL

CE

RE

525

526

527 A

A : 0 to 30 ns oBusy signal is not output.

RY/BY

Busy

tCRY

PROGRAMMING AND ERASING CHARACTERISTICS

(Ta 0° to 70°C, VCC 2.7 V to 3.6 V)

SYMBOL

PARAMETER

MIN

tPROG

Programming Time



tDBSY

Dummy Busy Time for Multi Block

Programming



tMBPBSY

Multi Block Program Busy Time



Number of Programming Cycles on Same

N

Page



tBERASE

Block Erasing Time



(1): Refer to Application Note (12) toward the end of this document.

TYP.

200

2

200



2

MAX

1000

10

1000

3

10

UNIT

Ps

Ps

Ps

ms

NOTES

(1)

2003-01-10 5/44

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