SI4012 Просмотр технического описания (PDF) - Silicon Laboratories

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SI4012

CRYSTAL-LESSFSK/OOK RF TRANSMITTER

Silicon Laboratories 

1.1. Definition of Test Conditions

Production Test Conditions:

 TA = +25 °C.

 VDD = +3.3 VDC.

 TX output power measured at 100 MHz.

 All RF output levels referred to the pins of the Si4012 (not the RF module).

Qualification Test Conditions:

 TA = –40 to +85 °C.

 VDD = +1.8 to +3.6 VDC.

 All RF output levels referred to the pins of the Si4012 (not the RF module).

Si4012

Rev 1.1

7

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