HI1176(1998) Просмотр технического описания (PDF) - Intersil
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HI1176 Datasheet PDF : 11 Pages
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Test Circuits
HI1176
+V
S2
-
S1 : ON IF A < B
+
S1
S2 : ON IF A > B
-V
VIN
DUT
HI1176
A<B A>B
COMPARATOR
8
8
A8
B8
DVM
A1
A0
“0”
CLK (20MHz)
B1
B0
“1”
CONTROLLER
BUFFER
000 • • • 00
8
TO
111 • • • 10
FIGURE 8. INTEGRAL AND DIFFERENTIAL NON-LINEARITY ERROR AND OFFSET VOLTAGE TEST CIRCUIT
2.6V
fC -1kHz
SG
0.6V
1
AMP
2
VIN DUT
HI1176
NTSC
SIGNAL
40 IRE
SOURCE 100 MODULATION
2.6V
IRE
0
-40
BURST
SYNC
0.6V
SG
(CW) fC
8 TTL
ECL
TTL
ECL
HI20201
1
8
10-BIT
D/A
2
CLK
620
-5.2V
620
-5.2V
ERROR RATE
HPF
COUNTER
VECTOR
SCOPE
DG
DP
FIGURE 9. MAXIMUM OPERATIONAL SPEED AND DIFFERENTIAL GAIN AND PHASE ERROR TEST CIRCUIT
2.6V
0.6V
VDD
VRT
VIN
VRB
CLK
OE
GND
IOL
VOL
+
-
2.6V
0.6V
VDD
VRT
VIN
VRB
CLK
OE
GND
IOH
VOH
+
-
FIGURE 10. DIGITAL OUTPUT CURRENT TEST CIRCUIT
4-11
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