FB2040A Просмотр технического описания (PDF) - Philips Electronics

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производитель

FB2040A

8-bit Futurebus + transceiver.

Philips Electronics 

Philips Semiconductors

8-bit Futurebus+ transceiver

Product specification

FB2040A

DC ELECTRICAL CHARACTERISTICS

Over recommended operating free-air temperature range unless otherwise noted.

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

UNIT

MIN TYP2 MAX

IOH

High level output current B0 – B7

VCC = MAX, VIL = MAX, VIH = MIN, VOH = 2.1V

100 µA

IOFF Power-off output current B0 – B7

VCC = 0.0V, VIL = MAX, VIH = MIN, VOH = 2.1V

100 µA

VOH

High-level output voltage AO0 – AO73 VCC = MIN, VIL = MAX, VIH = MIN, IOH = -3mA

2.5 2.85

V

AO0 – AO73 VCC = MIN, VIL = MAX, VIH = MIN, IOL = 24mA

0.33 0.5

VOL

Low-level output voltage

B0 – B7

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 80mA

.75 1.0 1.10

V

VCC = MIN, VIL = MAX, VIH = MIN, IOL = 100mA

1.15

VIK

Input clamp voltage

VCC = MIN, II = IIK

-1.2 V

II

Input current at maximum

input voltage

OEB0, OEB1,

OEA, AI0–AI7

VCC = MAX, VI = GND or 5.5V

±50 µA

IIH

High-level input current

IIL

Low-level input current

IOZH

IOZL

IOS

Off-state output current

Off-state output current

Short-circuit output

current4

OEB0, OEB1,

OEA, AI0–AI7

B0 – B7

OEB0, OEB1,

OEA, AI0–AI7

B0 – B7

AO0 – AO7

AO0 – AO7

AO0 – AO7

only

VCC = MAX, VI = 2.7V

VCC = MAX, VI = 2.1V

VCC = MAX, VI = 0.5V

VCC = MAX, VI = 0.75V

VCC = MAX, VO = 2.7V

VCC = MAX, VO = 0.5V

VCC = MAX, VO = 0.0V

20

µA

100

-20

µA

-100

50

µA

-50 µA

-30

-150 mA

ICC

Supply current (total)

ICCZ (standby)

ICCB, AIn to

Bn

VCC = MAX

VCC = MAX, outputs Low or High

ICCA, Bn to

AOn

VCC = MAX, outputs Low

19

30

40

60

mA

22

35

ICCA, Bn to

AOn

VCC = MAX, outputs High

19

35

NOTES:

1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operation conditions for the applicable type.

2. All typical values are at VCC = 5V, TA = 25°C.

3. Due to test equipment limitations, actual test conditions are VIH = 1.8V and VIL = 1.3V for the B side.

4. Not more than one output should be shorted at a time. For testing IOS, the use of high-speed test apparatus and/or sample-and-hold

techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged

shorting of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In

any sequence of parameter tests, IOS should be performed last.

1995 May 25

7

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