WF128K32-XG1TX5 Просмотр технического описания (PDF) - White Electronic Designs => Micro Semi
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WF128K32-XG1TX5 Datasheet PDF : 16 Pages
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WF128K32-XXX5
AC CHARACTERISTICS WRITE/ERASE/PROGRAM OPERATIONS, CS CONTROLLED
(VCC = 5.0V, VSS = 0V, TA = -55°C TO+125°C)
Parameter
Write Cycle Time
WE Setup Time
CS Pulse Width
Address Setup Time
Data Setup Time
Data Hold Time
Address Hold Time
WE Hold from WE High
CS Pulse Width High
Duration of Programming Operation
Duration of Erase Operation
Read Recovery before Write
Chip Programming Time
Symbol
tAVAV tWC
tWLEL tWS
tELEH
tCP
tAVEL tAS
tDVEH tDS
tEHDX tDH
tELAX tAH
tEHWH tWH
tEHEL
tCPH
tWHWH1
tWHWH2
tGHEL
-50
-60
-70
Min
50
Max
Min
60
Max
Min
70
Max
0
0
0
25
30
35
0
0
0
25
30
30
0
0
0
40
45
45
0
0
0
20
20
20
14
14
14
2.2 60 2.2 60 2.2 60
0
0
0
12.5
12.5
12.5
-90
Min
90
Max
0
45
0
45
0
45
0
20
14
2.2 60
0
12.5
-120
-150
Unit
Min Max Min Max
120
150
ns
0
0
ns
50
50
ns
0
0
ns
50
50
ns
0
0
ns
50
50
ns
0
0
ns
20
20
ns
14
14
µs
2.2 60 2.2 60 sec
0
0
ns
12.5
12.5 sec
FIG. 4 AC TEST CIRCUIT
White Electronic Designs Corporation • (602) 437-1520 • www.whiteedc.com
4
AC TEST CONDITIONS
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 3.0 V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Notes:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75 ý.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive load circuit.
ATE tester includes jig capacitance.
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