NLX2G08 Просмотр технического описания (PDF) - ON Semiconductor
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NLX2G08 Datasheet PDF : 8 Pages
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NLX2G08
MAXIMUM RATINGS
Symbol
VCC
VIN
VOUT
IIK
IOK
IO
ICC
IGND
TSTG
TL
TJ
qJA
PD
MSL
Parameter
DC Supply Voltage
DC Input Voltage
DC Output Voltage
DC Input Diode Current
DC Output Diode Current
DC Output Source/Sink Current
DC Supply Current per Supply Pin
DC Ground Current per Ground Pin
Storage Temperature Range
Lead Temperature, 1 mm from Case for 10 Seconds
Junction Temperature Under Bias
Thermal Resistance (Note 1)
Power Dissipation in Still Air at 85°C
Moisture Sensitivity
VIN < GND
VOUT < GND
Value
*0.5 to +7.0
*0.5 to +7.0
*0.5 to VCC + 0.5
*50
*50
$50
$100
$100
*65 to )150
TBD
TBD
TBD
TBD
Level 1
Unit
V
V
V
mA
mA
mA
mA
mA
°C
°C
°C
°C/W
mW
FR
VESD
Flammability Rating
ESD Withstand Voltage
Oxygen Index: 28 to 34 UL 94 V−0 @ 0.125 in
Human Body Model (Note 2)
TBD
V
Machine Model (Note 3)
TBD
Charged Device Model (Note 4)
N/A
ILatchup
Latchup Performance Above VCC and Below GND at 125°C
(Note 5)
$500
mA
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality
should not be assumed, damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mm−by−1 inch, 2−ounce copper trace with no air flow.
2. Tested to EIA/JESD22−A114−A.
3. Tested to EIA/JESD22−A115−A.
4. Tested to JESD22−C101−A.
5. Tested to EIA/JESD78.
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
VCC
Power DC Supply Voltage
Operating 1.65
5.5
V
Data Retention Only
1.5
5.5
VIN
Digital Input Voltage (Note 6)
0
5.5
V
VOUT
Output Voltage
0
VCC
V
TA
Operating Free−Air Temperature
−55
+125
°C
Dt/DV
Input Transition Rise or Fall Rate
VCC = 1.8 V $0.15 V
0
VCC = 2.5 V $0.2 V
0
VCC = 3.3 V $0.3 V
0
VCC = 5.0 V $0.5 V
0
20
ns/V
20
10
5
Functional operation above the stresses listed in the Recommended Operating Ranges is not implied. Extended exposure to stresses beyond
the Recommended Operating Ranges limits may affect device reliability.
6. Unused inputs may not be left open. All inputs must be tied to a high− or low−logic input voltage level.
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